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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico

責任表示:
R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5776
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2005
ISSN:
0277786X
ISBN:
9780819457578 [0819457574]
請求記号:
P63600/5776
資料種別:
国際会議録
巻号一覧
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類似資料:

SPIE-The International Society for Optical Engineering

SPIE-The International Society for Optical Engineering

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