Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico

責任表示:

R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5776

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2005

ISSN:

0277786X

ISBN:

9780819457578 [0819457574]

請求記号:

P63600/5776

資料種別:

国際会議録