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Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA

責任表示:
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5770
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering, 2005
ISSN:
0277786X
ISBN:
9780819457516 [0819457515]
請求記号:
P63600/5770
資料種別:
国際会議録
巻号一覧
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