Optical Micro- and Nanometrology in Manufacturing Technology
- 責任表示:
- Gorecki
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5458
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering, 2004
- ISSN:
- 0277786X
- ISBN:
- 9780819453808 [0819453803]
- 請求記号:
- P63600/5458
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
2
国際会議録
Optical micro- and nanometrology in microsystems technology II : 8-10 April 2008, Strasbourg, France
Society of Photo-optical Instrumentation Engineers | |
Society of Photo-optical Instrumentation Engineers |
American Society of Mechanical Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
American Society of Mechanical Engineers |