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X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California

責任表示:
Silvano Fineschi, chair
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3443
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering, 1998
ISSN:
0277786X
ISBN:
9780819428981 [0819428981]
請求記号:
P63600/3443
資料種別:
国際会議録
巻号一覧
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