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Influences of interface and dislocation behavior on microstructure evolution : symposium held November 27-30, 2000, Boston, Massachuusetts, U.S.A.

責任表示:
editors, Mark Aindow ... [et al.]
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
652
出版情報:
Warrendale, Pa.: Materials Research Society, 2001
ISSN:
02729172
ISBN:
9781558995628 [1558995625]
請求記号:
M23500/652
資料種別:
国際会議録
巻号一覧
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