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Thin films : stresses and mechanical properties X : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.

責任表示:
editors, Sean G. Corcoran ... [et al.]
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
795
出版情報:
Warrendale, Pa.: Materials Research Society, 2002
ISSN:
02729172
ISBN:
9781558997332 [1558997334]
請求記号:
M23500/795
資料種別:
国際会議録
巻号一覧
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