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Scanning probe microscopy : characterization, nanofabrication and device application of functional materials

責任表示:
edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号:
186
出版情報:
Dordrecht: Kluwer Academic Publishers, 2005
ISBN:
9781402030178 [1402030177]
請求記号:
N17050/186
資料種別:
国際会議録
巻号一覧
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類似資料:

1 国際会議録 Applications of scanned probe microscopy to polymers

American Chemical Society
7 国際会議録 Scanning microscopy technologies and applications

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8 国際会議録 Nanofabrication: Technologies, Devices, and Applications

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3 国際会議録 Scanning probe microscopy of polymers

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9 国際会議録 Scanning probe microscopies : 20-22 January 1992, Los Angeles, California

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4 国際会議録 Electrochemical Scanning Probe Microscopy: From Theory to Real-World Applications

Electrochemical Society
10 国際会議録 Nanofabrication: Technologies, Devices, and Applications II

SPIE - The International Society of Optical Engineering
5 国際会議録 Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium

Electrochemical Society
11 国際会議録 Nonlinear Materials: Growth, Characterization, Devices, and Applications

SPIE-The International Society for Optical Engineering
6 国際会議録 Scanned probe microscopy, Santa Barbara, CA 1991

American Institute of Physics
12 国際会議録 Scanning probe microscopies III : 6-7 February 1995, San Jose, California

Society of Photo-optical Instrumentation Engineers
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