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Defects in SiO[2] and related dielectrics : science and technology

責任表示:
edited by G. Pacchioni, L. Skuja, D. L. Griscom
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号:
2
出版情報:
Dordrecht: Kluwer Academic Publishers, 2000
ISBN:
9780792366850 [0792366859]
請求記号:
N17050/2
資料種別:
国際会議録
巻号一覧
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