Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

責任表示:

edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

1994-1

出版情報:

Pennington, NJ: Electrochemical Society, 1993

ISSN:

01616374

ISBN:

9781566770378 [1566770378]

請求記号:

E23400/941393

資料種別:

国際会議録