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Chemical and biological standoff detection : 28-30 October 2003, Providence, Rhode Island, USA

責任表示:
James O. Jensen, Jean-Marc Thériault, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5268
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering, 2004
ISSN:
0277786X
ISBN:
9780819451576 [0819451576]
請求記号:
P63600/5268
資料種別:
国際会議録
巻号一覧
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