Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France | 東京工業大学附属図書館資料名データベース

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Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France

責任表示:: Roland Gely, David Rimmer, Lingli Wang, chairs
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 5252
出版情報:: Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering, 2004
ISSN:: 0277786X
ISBN:: 9780819451361 [0819451363]
請求記号:: P63600/5252
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00013597
シリーズＩＤ:	PA00000029
会議名:	SPIE Optical Systems Design : Optical fabrication, testing, and metrology
回次:	2003
会議開催地:	St. Etienne, France
会議開催年:	2003.09.30-2003.10.03

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