Blank Cover Image

Risk methodologies for technological legacies

責任表示:
edited by Dennis C. Bley ... [et al.]
シリーズ名:
NATO science series. Series 4, Earth and environmental sciences
シリーズ巻号:
18
出版情報:
Dordrecht: Kluwer Academic Publishers, 2003
ISBN:
9781402012570 [1402012578]
請求記号:
N17070/18
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

1 国際会議録 Technological risk assessment

Martinus Nijhoff Publishers
7 国際会議録 Electron correlation methodology

American Chemical Society
2 国際会議録 Basic technological advances

American Society of Mechanical Engineers
8 国際会議録 Design methodology and relationships with science

Kluwer Academic Publishers
3 国際会議録 Walking : biological and technological aspects

Springer-Verlag
9 国際会議録 Glycomimetics : modern synthetic methodologies

American Chemical Society
4 国際会議録 Organizational learning and technological change

Springer
10 国際会議録 Focal plane methodologies III

Society of Photo-optical Instrumentation Engineers
5 国際会議録 Lecithin : technological, biological, and therapeutic aspects

Plenum Press
11 国際会議録 Methodologies in asymmetric catalysis

American Chemical Society
6 国際会議録 Design methodologies for VLSI circuits

Sijthoff & Noordhoff International Publishers
12 国際会議録 Methodology for genetic studies of twins and families

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12