Noise in Devices and Circuits
- 責任表示:
- Deen
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5113
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2003
- ISSN:
- 0277786X
- ISBN:
- 9780819449733 [0819449733]
- 請求記号:
- P63600/5113
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
国際会議録
Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
SPIE - The International Society of Optical Engineering |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
Noordhoff International Publishing |
Martinus Nijhoff Publishers |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |