Optical design and testing : 15-18 October 2002, Shanghai, China | 東京工業大学附属図書館資料名データベース

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Optical design and testing : 15-18 October 2002, Shanghai, China

責任表示:: Zhicheng Weng, Jose m. Sasian, Yongtian Wang, chairs
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 4927
出版情報:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2002
ISSN:: 0277786X
ISBN:: 9780819447166 [0819447161]
請求記号:: P63600/4927
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00012776
シリーズＩＤ:	PA00000029
会議名:	Photonics Asia : Optical Design and Testing
回次:	2002
会議開催地:	Shanghai, China
会議開催年:	2002.10.15-2002.10.18

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