Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
- 責任表示:
- Meyendorf
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4703
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2002
- ISSN:
- 0277786X
- ISBN:
- 9780819444516 [0819444510]
- 請求記号:
- P63600/4703
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
American Society of Mechanical Engineers |
American Society of Mechanical Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
国際会議録
Smart Nondestructive Evaluation and Health Monitoring of Structural and Biological Systems II
SPIE-The International Society for Optical Engineering |
American Ceramic Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |