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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA

責任表示:
Aland K. Chin ... [et al.] chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4648
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2002
ISSN:
0277786X
ISBN:
9780819443878 [0819443875]
請求記号:
P63600/4648
資料種別:
国際会議録
巻号一覧
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