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Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA

責任表示:
Olivier Delage, Eric Munro, John A. Rouse chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4510
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2001
ISSN:
0277786X
ISBN:
9780819442246 [0819442240]
請求記号:
P63600/4510
資料種別:
国際会議録
巻号一覧
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