Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA
- 責任表示:
- Emile J. Knystautas, Wiley P. Kirk, Valerie Browning, chairs
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4468
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering, 2001
- ISSN:
- 0277786X
- ISBN:
- 9780819441829 [0819441821]
- 請求記号:
- P63600/4468
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
国際会議録
Optical diagnostics for fluids, solids, and combustion : July 31-2 August 2001 San Diego, USA
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
国際会議録
Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
国際会議録
Lidar remote sensing for industry and environment monitoring II : 30-31 July 2001, San Diego, USA
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |