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Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA

責任表示:
Edward F. Kelley, Tolis Voutsas, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4295
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2001
ISSN:
0277786X
ISBN:
9780819439734 [0819439738]
請求記号:
P63600/4295
資料種別:
国際会議録
巻号一覧
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