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Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China

責任表示:
Guang Hui Wei, Sheng Liu, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4223
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering, 2000
ISSN:
0277786X
ISBN:
9780819438942 [0819438944]
請求記号:
P63600/4223
資料種別:
国際会議録
巻号一覧
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