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Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China

責任表示:
FeiJun Song ... [et al.], chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4221
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering, 2000
ISSN:
0277786X
ISBN:
9780819438928 [0819438928]
請求記号:
P63600/4221
資料種別:
国際会議録
巻号一覧
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