Blank Cover Image

Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

責任表示:
Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4189
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2001
ISSN:
0277786X
ISBN:
9780819438546 [0819438545]
請求記号:
P63600/4189
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

SPIE-The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society for Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE - The International Society of Optical Engineering

SPIE-The International Society for Optical Engineering

SPIE-The International Society for Optical Engineering

SPIE - The International Society for Optical Engineering

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12