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Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA

責任表示:
Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4189
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2001
ISSN:
0277786X
ISBN:
9780819438546 [0819438545]
請求記号:
P63600/4189
資料種別:
国際会議録
巻号一覧
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