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Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA

責任表示:
David B. Chenault, Michaek J. Duggin, Walter G. Egan, Dennis H. Goldstein, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4133
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering, 2000
ISSN:
0277786X
ISBN:
9780819437785 [0819437786]
請求記号:
P63600/4133
資料種別:
国際会議録
巻号一覧
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