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Service life prediction : methodology and metrologies

責任表示:
Jonathan W. Martin, editor, David R. Bauer, editor
シリーズ名:
ACS symposium series
シリーズ巻号:
805
出版情報:
Washington, DC: American Chemical Society, 2002
ISSN:
00976156
ISBN:
9780841236936 [0841236933]
請求記号:
A05800/805
資料種別:
国際会議録
巻号一覧
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類似資料:

American Chemical Society

SPIE-The International Society for Optical Engineering

SPIE-The International Society for Optical Engineering

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