Optical pattern recognition XIX : 17-18 March 2008, Orlando, Florida, USA

Editor(s), etc.:

David P. Casasent, Tien-Hsin Chao, editors ; sponsored and published by SPIE

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6977

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers, 2008

ISSN:

0277786X

ISBN:

9780819471680 [0819471682]

Call no.:

P63600/6977

Type:

Conference Proceedings