Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

Editor(s), etc.:

edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

1994-1

Pub. info.:

Pennington, NJ: Electrochemical Society, 1993

ISSN:

01616374

ISBN:

9781566770378 [1566770378]

Call no.:

E23400/941393

Type:

Conference Proceedings