1.

国際会議録
国際会議録
1. Weighted bipolar neural network with high-capacity stable storage
D. Guo ; Z. Chen ; R. Liu ; B. Wu
出版情報: Second International Conference on Optoelectronic Science and Engineering '94 : 15-18 August 1994, Beijing, China.  pp.680-682,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2321
2.

国際会議録
国際会議録
2. Circular harmonic phase component for pattern recognition
X. Chen ; Z. Chen
出版情報: Second International Conference on Optoelectronic Science and Engineering '94 : 15-18 August 1994, Beijing, China.  pp.699-701,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2321
3.

国際会議録
国際会議録
3. Using the 2n-element number neural network model to recognize the 2(2n)-state images
J. Shuai ; Z. Chen ; R. Liu ; B. Wu
出版情報: Nonlinear image processing VI : 6-9 February 1995, San Jose, California.  pp.632-638,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2424
4.

国際会議録
国際会議録
4. New principle for colormetric measurements
Z. Chen ; H. Qian
出版情報: Second International Conference on Optoelectronic Science and Engineering '94 : 15-18 August 1994, Beijing, China.  pp.24-26,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2321
5.

国際会議録
国際会議録
5. Microfocusing optics for hard xrays fabricated by x-ray lithography
A.A. Krasnoperova ; Z. Chen ; F. Cerrina ; E. Difabrizio ; M. Gentili
出版情報: X-ray microbeam technology and applications : 11-12 July, 1995, San Diego, California.  pp.15-26,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2516
6.

国際会議録
国際会議録
6. Effect of the high-contrast-mask sidewall slope on deep x-ray lithography
Z. Chen ; A.A. Krasnoperova ; Y. Zhu ; F. Cerrina
出版情報: Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V : 20-21 February 1995, Santa Clara, California.  pp.75-85,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2437
7.

国際会議録
国際会議録
7. Medical image supercomputing in a PACS infrastructure
B.K.T. Ho ; Z. Chen ; R.K. Panwar ; R.M. Sadri ; P. Saipetch
出版情報: Medical imaging 1995, PACS design and evaluation : engineering and clinical issues : 28 February-2 March 1995, San Diego, California.  pp.536-546,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2435
8.

国際会議録
国際会議録
8. Scale-translation filtering for wideband correlated noise attenuation
F. Bao ; N. Erdol ; Z. Chen
出版情報: Wavelet applications II : proceedings : 17-21 April 1995, Orlando, Florida.  pp.652-660,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2491