Wang,J. ; Walton, T. D. ; Li, M. J. ; Nolan, A. D. ; Berkey, E. G. ; Koh, J. ; Chen, X. ; Zenteno, A. L.
出版情報:
ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.602802-602802, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Targets and backgrounds VII : characterization and representation : 16-17 April 2001, Orland, USA. pp.42-49, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced signal processing algorithms, architectures, and implementations XI : 1-3 August, 2001, San Diego, [Calif.] USA. pp.429-437, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA. pp.244-246, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China. pp.337-340, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optomechatronic systems II : 29-31 October 2001, Newton, USA. pp.238-244, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.95-98, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics for fluids, solids, and combustion : July 31-2 August 2001 San Diego, USA. pp.265-271, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA. pp.154-166, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France. pp.386-390, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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In-vitro diagnostic instrumentation : 26-27 January 2000, San Jose, California. pp.177-184, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser applications in microelectronic and optoelectronic manufacturing V : 24-26 January 2000, San Jose, USA. pp.347-354, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.307-309, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Wavelet applications in signal and image processing VII : 19-23 July 1999, Denver, Colorado. pp.682-690, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2000 : mathematics and control in smart structures : 6-9 March, 2000, Newport Beach, USA. pp.553-561, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.67-73, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.202-206, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.214-219, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.138-141, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Photorefractive fiber and crystal devices : materials, optical properties, and applications III : 28-29 July, 1997, San Diego, California. pp.153-156, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Hybrid image and signal processing V : 8 April 1996, Orlando, Florida. pp.82-93, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Applications of artificial neural networks in image processing II : 12-13 February, 1997, San Jose, California. pp.36-41, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Acquisition, tracking, and pointing XI : 23-24 April 1997, Orlando, Florida. pp.43-53, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.57-65, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California. Part 1 pp.702-713, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.608-613, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Radiation sources and radiation interactions : 19 July 1999, Denver, Colorado. pp.117-126, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser material crystal growth and nonlinear materials and devices : 27-28 January 1999, San Jose, California. pp.9-14, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.104-107, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 1999 : smart electronics and MEMS : 1-3 March, 1999, Newport Beach, California. pp.93-103, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization: measurement, analysis, and remote sensing II : 19-21 July 1999, Denver, Colorado. pp.354-365, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Process control and sensors for manufacturing II : 3-4 March 1999, Newport Beach, California. pp.84-92, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polymer photonic devices : 28-30 January 1998 San Jose, California. pp.75-83, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Human vision and electronic imaging : 29 January-1 February 1996, San Jose, California. pp.74-85, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hyperspectral remote sensing and application : 15-17 September 1998, Beijing, China. pp.173-178, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea. Part1 pp.509-510, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.331-337, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.438-442, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.221-226, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Air monitoring and detection of chemical and biological agents II : 21-22 September 1999, Boston, Massachusetts. pp.62-70, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.674-685, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.125-133, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.243-247, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.10-14, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.91-95, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.55-59, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.87-90, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.835-838, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering