Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.588407-588407, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Li, X. ; Hu, X. ; Zhang, B. ; Zhang, X. ; Li, J. ; Li, X.
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Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium. pp.59831O-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium. pp.59831W-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Bykhovski, A. ; Li, X. ; Globus, T. ; Khromova, T. ; Gelmont, B. ; Woolard, D. ; Samuels, A. C. ; Jensen, J. O.
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Chemical and biological standoff detection III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.59950N-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Li, H. ; Peng, H. ; Li, X. ; Veroustraete, F. ; Chen, Y.
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Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium. pp.59831V-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium. pp.59831M-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.59640Z-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.60320R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : Large mirrors and telescopes :2-5 November 2005, Xian, China. pp.614803-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Structure, relaxation, and physical aging of glassy polymers : symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A.. pp.61-70, 1991. Pittsburg, Pa.. Materials Research Society
Signal and data processing of small targets 2006 : 18-20 April 2006, Kissimmee, Florida, USA. pp.623608-623608, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.970-973, 2006. Uetikon-Zuerich. Trans Tech Publications
Progress in zeolite and microporous materials : proceedings of the 11th International Zeolite Conference, Seoul, Korea, August 12-17, 1996. A pp.615-, 1997. Amsterdam. Elsevier
Li, X. ; Chen, J. ; Shang, T. ; Jiang, W. ; Yan, M.
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APOC 2001: Asia-Pacific Optical and Wireless Communications : optical switching and optical interconnection : 12-15 November 2001, Beijing, Chaina. pp.139-146, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Ocean remote sensing and applications : 24-26 October 2002, Hangzhou, China. pp.606-618, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
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Electronic imaging and multimedia technology III : 15-17 October, 2002, Shanghai, China. pp.369-375, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
APOC 2001: Asia-Pacific Optical and Wireless Communications : wireless and mobile communications : 12-15 November 2001, Beijing, China. pp.200-205, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Microwave remote sensing of the atmosphere and environment III : 24-25 October 2002, Hangzhou, China. pp.405-412, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lu, H. ; Wen, J. ; Li, X. ; Li, T. ; Han, G. ; Liang, Z.
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Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA. Part One pp.20-28, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Li, X. ; He, L. ; Everding, B. ; Han, C.Y. ; Wee, W.G.
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Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA. pp.1-12, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Astronomical structures and mechanisms technology : 21-22 June 2004, Glasgow, Scotland, United Kingdom. pp.670-676, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Laser source and system technology for defense and security : 28-29 March, 2005, Orlando, Florida, USA. pp.39-47, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Dai, X. ; Jiang, X. ; Li, X. ; Dong, G. ; Yang, S. ; Zhou, X.
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Optical design and testing II : 8-12 November 2004, Beijing, China. pp.688-693, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Yu, C. -C. ; Shieh, M. -F. ; Liu, E. ; Lin, B. ; Lin, H. ; Chacko, M. ; Li, X. ; Lei, W. -K. ; Ho, J. ; Wu, X.
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Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA. pp.262-273, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China. pp.370-374, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.34-41, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Li, X. ; Lin, J. ; Wu, C. ; Wang, R. ; Li, Y. ; Jia, C.
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Biomolecular photonics and multidimensional microscopy : 8-11 June 2003, Wuhan, China. pp.99-104, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Biomolecular photonics and multidimensional microscopy : 8-11 June 2003, Wuhan, China. pp.93-98, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China. pp.212-218, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China. pp.351-356, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Bai, J. ; Li, X. ; Hu, X. ; Zhang, X. ; Zhao, Y. ; Zhang, B. ; Tong, Q. ; Zheng, L.
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Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China. pp.325-329, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina. pp.142-145, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China. pp.478-483, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Wnag, Q. ; Dong, R. ; Chen, L. ; Chen, T. ; Li, X.
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3799-3802, 2005. Uetikon-Zuerich. Trans Tech Publications
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina. pp.151-153, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Yang, F. ; Han, Z. ; Zhang, F. ; Cao, G. ; Hou, P. ; Tang, Z. ; Lu, M. ; Li, X.
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Multispectral and hyperspectral remote sensing instruments and applicaionts :25-27 October 2002, Hangzhou, China. pp.227-236, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Li, X. ; Chen, Z. ; Siegel, M.P. ; Taflove, A. ; Backman, V.
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Nanobiophotonics and biomedical applications II : 24-27 January 2005, San Jose, California, USA. pp.14-22, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
He, Q. ; Li, H. ; Li, X. ; Yang, Q. ; Pan, X. ; Gao, W.
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Remote sensing and modeling of ecosystems for sustainability : 2-4 August 2004, Denver, Colorado, USA. pp.448-454, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.955-960, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Liang, P. ; Yu, J. ; Zu, G. ; Li, X. ; Shen, Y. ; Qian, L. ; Zou, L.
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Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China. pp.507-514, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Liu, X. ; Liu, J. ; Li, X. ; Cheong, S.-K. ; Shu, D. ; Wang, J. ; Tate, M.W. ; Ercan, A. ; Schuette, D.R. ; Renzi, M.J. ; Woll, A. ; Gruner, S.M.
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Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.21-28, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Sensors, systems, and next-generation satellites IX : 20-22 September 2005, Bruges, Belgium. pp.59781V-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhu, G. ; Xu, J. ; Gu, X. ; Kong, L. ; Cao, F. ; Li, X.
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ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.60281C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.596414-596414, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Sun, H. ; Jia, T. ; Li, X. ; Li, C. ; Feng, D. ; Xu, S. ; Xu, Z.
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ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.60281D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Liang, C. ; Lee, K. F. ; Voss, P.L. ; Comdorf, E. ; Kanter, G. S,. ; Chen, J. ; Li, X. ; Kumar, P.
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Quantum communications and quantum imaging III : 2-4 August 2005, San Diego, California, USA. pp.589314-589314, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3803-3806, 2005. Uetikon-Zuerich. Trans Tech Publications
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.293-300, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium. pp.448-454, 2001. Pennington, N.J.. Electrochemical Society