Data mining and applications : 23-24 October 2001, Wuhan, China. pp.29-32, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Data mining and applications : 23-24 October 2001, Wuhan, China. pp.15-19, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Data mining and applications : 23-24 October 2001, Wuhan, China. pp.25-28, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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International Workshop on Photonics and Imaging in Biology and Medicine : 8-10 October 2001, Wuhan, China. pp.1-8, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Subsurface and surface sensing technologies and applications III : 30 July-1 August 2001, San Diego, USA. pp.159-166, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.280-283, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.410-416, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Data mining and applications : 23-24 October 2001, Wuhan, China. pp.128-132, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Image compression and encryption technologies : 22-24 October 2001, Wuhan, China. pp.220-224, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California. pp.496-502, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Optical microlithography XI : 25-27 February 1998, Santa Clara, California. pp.502-509, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Lithography for semiconductor manufacturing : 19-21 May 1999, Edinburgh, Scotland. pp.253-260, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical microlithography XI : 25-27 February 1998, Santa Clara, California. pp.951-957, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Current developments in optical design and optical engineering VIII : 19-21 July 1999, Denver, Colorado. pp.65-72, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.13-22, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Smart structures and materials 1997 : Smart materials technologies : 3-4 March 1997, San Diego, California. pp.271-278, 1997. Bellingham. SPIE-The International Society for Optical Engineering
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Smart structures and materials 1997 : Smart materials technologies : 3-4 March 1997, San Diego, California. pp.264-270, 1997. Bellingham. SPIE-The International Society for Optical Engineering
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Intense microwave pulses IV : 7-8 August 1996, Denver, Colorado. pp.47-56, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Rare-earth-doped devices II : 26-27 January 1998, San Jose, California. pp.46-51, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.105-112, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Smart materials, structures, and integrated systems : 11-13 December 1997, Adelaide, Australia. pp.390-400, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.180-182, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.426-428, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Optical microlithography XI : 25-27 February 1998, Santa Clara, California. pp.567-578, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California. pp.214-224, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida. pp.10-21, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.492-503, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.66-71, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California. Part 2 pp.1272-1279, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.412-414, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.409-414, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Electro-Optic and second harmonic generation materials, devices, and applications. pp.275-278, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electro-Optic and second harmonic generation materials, devices, and applications. pp.284-288, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electro-Optic and second harmonic generation materials, devices, and applications. pp.279-283, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.823-826, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.273-276, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Inorganic optical materials II : 1-3 August, 2000, San Diego, USA. pp.307-315, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.384-392, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
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Electro-Optic and second harmonic generation materials, devices, and applications. pp.146-151, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electro-Optic and second harmonic generation materials, devices, and applications. pp.152-156, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Electro-Optic and second harmonic generation materials, devices, and applications. pp.231-234, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China. pp.95-99, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Optical pattern recognition VIII : 22-23 April, 1997, Orlando, Florida. pp.288-298, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China. pp.18-22, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China. pp.128-133, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China. pp.137-143, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.413-420, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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