1.

国際会議録
国際会議録
1. RELIABILITY OF INTERCONNECTS EXHIBITING BIMODAL ELECTROMIGRATION-INDUCED FAILURED DISTRIBUTIONS
Kahn, H. ; Thompson, C. V. ; Cooperman, S. S.
出版情報: Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.65-72,  1992.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 265
2.

国際会議録
国際会議録
2. ELECTROMIGRATION IN BICRYSTAL AI LINES
Longworth, Hai P. ; Thompson, C. V.
出版情報: Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.95-100,  1992.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 265
3.

国際会議録
国際会議録
3. COMPUTER SIMULATION OF GRAIN GROWTH IN THIN-FILM INTERCONNECT LINES
Walton, D. T. ; Frost, H. J. ; Thompson, C. V.
出版情報: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.219-224,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 225
4.

国際会議録
国際会議録
4. *KINETICS AND THERMODYNAMICS OF AMORPHOUS SILICIDE FORMATION IN METAL/AMORPHOUS-SILICON MULTILAYER THIN FILMS
Thompson, C. V. ; Clevenger, L. A. ; DeAvillez, R. ; Ma, E. ; Miura, H.
出版情報: Thin film structures and phase stability : symposium held April 16-17, 1990, San Francisco, California, U.S.A..  pp.61-70,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 187
5.

国際会議録
国際会議録
5. KINETIC AND THERMODYNAMIC ASPECTS OF PHASE EVOLUTION IN Ti/a-Si MULTILAYER FILMS
Ma, E. ; Clevenger, L. A. ; Thompson, C. V. ; Tu, K. N.
出版情報: Thin film structures and phase stability : symposium held April 16-17, 1990, San Francisco, California, U.S.A..  pp.83-88,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 187
6.

国際会議録
国際会議録
6. EPITAXIAL GRAIN GROWTH AND ORIENTATION METASTABILITY IN HETEROEPITAXIAL THIN FILMS
Floro, J. A. ; Thompson, C. V.
出版情報: Thin film structures and phase stability : symposium held April 16-17, 1990, San Francisco, California, U.S.A..  pp.273-278,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 187
7.

国際会議録
国際会議録
7. MISFIT STRAIN RELIEF BEYOND THE CRITICAL THICKNESS USING CURVATURE MEASUREMENTS AND IN SITU CHARACTERIZATION OF THE MAGNETO-OPTIC KERR EFFECT
Inglefield, H. E. ; Bochi, G. ; Ballentine, C. A. ; O'Handley, R. C. ; Thompson, C. V.
出版情報: Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.265-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 356
8.

国際会議録
国際会議録
8. Modelling of Grain Structure Evolution and its Impact on the Reliability of Al(Cu) Thin Film Interconnects
Riege, S. P. ; Andleigh, V. ; Thompson, C. V. ; Frost, H. J.
出版情報: Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A..  pp.219-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 490
9.

国際会議録
国際会議録
9. USE OF MAGNETO-OPTIC KERR EFFECT MEASUREMENTS TO STUDY STRAIN AND MISFIT ACCOMMODATION IN THIN FILMS OF Ni/Cu (100)
Inglefield, H. E. ; Ballentine, C. A. ; Bochi, G. ; Bogomolov, S. S. ; O'Handley, R. C. ; Thompson, C. V.
出版情報: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.765-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 308
10.

国際会議録
国際会議録
10. Grain Structure Statistics in As-Patterned and Annealed Interconnects
Fayad, W. ; Andleigh, V. ; Thompson, C. V. ; Frost, H. J.
出版情報: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.159-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 516
11.

国際会議録
国際会議録
11. Diffusion and Electromigration of Cu in Single Crystal Al Interconnects
Srikar, V. T. ; Thompson, C. V.
出版情報: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.71-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 516
12.

国際会議録
国際会議録
12. GRAIN GROWTH IN THIN FILMS WITH VARIABLE GRAIN BOUNDARY ENERGY
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
出版情報: Mechanisms of thin film evolution.  pp.485-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 317
13.

国際会議録
国際会議録
13. Coupled Stress Evolution in Polygranular Clusters and Bamboo Segments in Near-Bamboo Interconnects
Knowlton, B. D. ; Clement, J. J. ; Frank, R. I. ; Thompson, C. V.
出版情報: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.189-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 391
14.

国際会議録
国際会議録
14. Modeling of the Structure and Reliability of Near-Bamboo Interconnects
Thompson, C. V. ; Joo, Y.-C. ; Knowlton, B. D.
出版情報: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.163-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 391
15.

国際会議録
国際会議録
15. THE EFFECT OF THERMAL HISTORY ON INTERCONNECT RELIABILITY
Thompson, C. V.
出版情報: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.383-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 309
16.

国際会議録
国際会議録
16. MAGNETIC ANISOTROPY IN EPITAXIAL Ni/Cu (100) THIN FILMS
Bochi, C. ; Ballentine, C. A. ; Inglefield, H. E. ; Bogomolov, S. S. ; Thompson, C. V. ; O'Handley, R. C.
出版情報: Magnetic ultrathin films : multilayers and surfaces, interfaces and characterization : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.309-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 313
17.

国際会議録
国際会議録
17. Failure in Tungsten-Filled Via Structures
Clement, J. J. ; Lloyd, J. R. ; Thompson, C. V.
出版情報: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.423-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 391
18.

国際会議録
国際会議録
18. A STATISTICAL CHARACTERIZATION OF ELECTROMIGRATION INDUCED OPEN FAILURES IN 2-LEVEL METAL STRUCTURES
Kahn, H. ; Thompson, C. V.
出版情報: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.15-20,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 225
19.

国際会議録
国際会議録
19. THE EFFECT OF SOLUTE DRAG ON GRAIN GROWTH IN THIN FILMS
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
出版情報: Mechanisms of thin film evolution.  pp.431-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 317
20.

国際会議録
国際会議録
20. ENERGY MINIMIZATION DURING EPITAXIAL GRAIN GROWTH: STRAIN VS. INTERFACIAL ENERGY
Floro, J. A. ; Carel, R. ; Thompson, C. V.
出版情報: Mechanisms of thin film evolution.  pp.419-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 317
21.

国際会議録
国際会議録
21. The Effect of Cu Distribution on Post-Patterning Grain Growth and Reliability of Al-1%Cu Interconnects
Knowlton, B. D. ; Frank, R. I. ; Thompson, C. V.
出版情報: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.361-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 391
22.

国際会議録
国際会議録
22. COMPUTER SIMULATION OF STRAIN ENERGY AND SURFACE- AND INTERFACE-ENERGY ON GRAIN GROWTH IN THIN FILMS
Carel, R. ; Thompson, C. V. ; Frost, H. J.
出版情報: Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.49-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 343
23.

国際会議録
国際会議録
23. MEAN FIELD ANALYSIS OF ORIENTATION SELECTIVE GRAIN GROWTH DRIVEN BY INTERFACE-ENERGY ANISOTROPY
Floro, J. A. ; Thompson, C. V.
出版情報: Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.65-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 343
24.

国際会議録
国際会議録
24. Interconnect Failure Mechanism Maps for Different Metallization Materials and Processes
Andleigh, V. K. ; Park, Y. J. ; Thompson, C. V.
出版情報: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.59-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 563