Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.205-208, 1988. Pittsburgh, Pa.. Materials Research Society
Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A.. pp.175-180, 1985. Pittsburgh, Pa.. Materials Research Society
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.153-168, 1985. Pittsburgh, Pa.. Materials Research Society
L:I, C.-J. ; Sun, Q. ; Lagowski, J. ; Gatos, H. C.
出版情報:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.441-446, 1985. Pittsburgh, Pa.. Materials Research Society
Nauka, K. ; Walukiewicz, W. ; Lagowski, J. ; Gatos, H. C.
出版情報:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.291-296, 1985. Pittsburgh, Pa.. Materials Research Society
Skowronski, M. ; Lin, D. G. ; Lagowski, J. ; Pawlowicz, L..M. ; Ko, K. Y. ; Gatos, H. C.
出版情報:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.207-212, 1985. Pittsburgh, Pa.. Materials Research Society