Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.. pp.87-92, 1989. Pittsburgh, Pa.. Materials Research Society
Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.. pp.93-98, 1989. Pittsburgh, Pa.. Materials Research Society
Jin, S. ; Hong, S. ; Kim, J. ; Park, Y. J. ; Min, H. S.
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Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.74-83, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
van Dam, R.L. ; Hendrickx, J.M. ; Borchers, B. ; Hong, S. ; Miller, T.W. ; Harmon, R.S.
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Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.1335-1344, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Woodman, A.S. ; Taylor, E.J. ; Anderson, E.B. ; Weil, R. ; Hong, S. ; Knapke, D.H. ; Fisher, G.L.
出版情報:
Proceedings of the Second International Symposium on Electrochemical Technology Applications in Electronics. pp.86-98, 1993. Pennington, NJ. Electrochemical Society
Hong, S. ; Bravman, J. C. ; Weihs, T. P. ; Kwon, O. K.
出版情報:
Electronic packaging materials science III : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.. pp.309-318, 1988. Pittsburgh, Pa.. Materials Research Society
Photonics technology in the 21st century : 27-29 November 2001, Singapore /John H. Marsh, Pallab Bhattacharya, Osamu Wada, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Nanyang Technological University(Singapore). pp.36-43, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
van Dam, R.L. ; Borchers, B. ; Hendrickx, J.M. ; Hong, S.
出版情報:
Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.648-657, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Cristoloveanu, S. ; Ionescu, A. ; Wetteroth, T. ; Shin, H. ; Munteanu, D. ; Gentil, P. ; Hong, S. ; Wilson, S. R.
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Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A.. pp.213-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.16-27, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Multicomponent oxide films for electronics : symposium held April 6-8, 1999, San Francisco, California, U.S.A.. pp.95-, 1999. Warrendale, PA. MRS-Materials Research Society
Shin, H. ; Im, H. ; Hong, S. ; Lee, K. ; Lim, G. ; Jeon, J. U. ; Kim, E. S. ; Pak, Y. E.
出版情報:
Organic/inorganic hybrid materials II : symposium held April 5-9, 1999, San Francisco, California, U.S.A.. pp.191-, 1999. Warrendale, PA. MRS-Materials Research Society
Khouchaf, L. ; Berling, D. ; Pierron-Bohnes, V. ; Pirri, C. ; Hong, S. ; Wetzel, P. ; Gewinner, G. ; Tuilier, M. H. ; Lefebvre, S. ; Cortes, R.
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Mechanisms and principles of epitaxial growth in metallic systems : symposium held April 13-14, 1998, San Francisco, California, U.S.A.. pp.75-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Targets and backgrounds XI : characterization and representation : 28-29 March 2005, Orlando, Florida, USA. pp.147-158, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Targets and backgrounds XI : characterization and representation : 28-29 March 2005, Orlando, Florida, USA. pp.159-170, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Targets and backgrounds XI : characterization and representation : 28-29 March 2005, Orlando, Florida, USA. pp.138-146, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kawaharada, M. ; Hong, S. ; Murashima, M. M. ; Kokubun, M. ; Itoh, T. ; Makishima, K. ; Miyawaki, R. ; Niko, H. ; Yanagida, T. ; Mitani, T. ; Nakazawa, K. ; Oonuki, K. ; Takahashi, T. ; Tamura, K. ; Tanaka, T. ; Terada, Y. ; Fukazawa, Y. ; Kawano, N. ; Kawashima, K. ; Ohno, M. ; Yamaoka, K. ; Abe, K. ; Suzuki, M. ; Tashiro, M. ; Yonetoku, D. ; Murakami, T.
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High-energy detectors in astronomy : 22-23 June 2004, Glasgow, Scotland, United Kingdom. pp.286-295, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Integrated Optics: Devices, Materials, and Technologies VII. pp.221-230, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
10th International Symposium on Nanostructures: Physics and Technology. pp.445-448, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Quantum Sensing: Evolution and Revolution from Past to Future. pp.138-144, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII. pp.53-64, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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