Lukyanchikova, N. R. ; Garbar, N. ; Smolanka, A. ; Simoen, E. ; Mercha, A. ; Claeys, C.
出版情報:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.208-214, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Mercha, A. ; Simoen, E. ; Decoutere, S. ; Claeys, C.
出版情報:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.193-207, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Simoen, E. ; Claeys, C. ; Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Tonelli, G. ; Degryse, O. ; Clauws, P.
出版情報:
Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.912-924, 2002. Pennington, NJ. Electrochemical Society
Simoen, E. ; Claeys, C. ; Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Tonelli, G. ; Degryse, O. ; Clauws, P.
出版情報:
Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.912-926, 2002. Pennington, NJ. Electrochemical Society
Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium. pp.153-172, 2003. Pennington, N.J.. Electrochemical Society
Camillo, L.M. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
出版情報:
Silicon-on-insulator technology and devices XII : proceedings of the international symposium. pp.119-124, 2005. Pennington, N.J.. Electrochemical Society
Srinivasan, P. ; Simoen, E. ; Pantisano, L. ; Claeys, C. ; Misra, D.
出版情報:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.151-160, 2005. Pennington, NJ. Electrochemical Society
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G. ; Mohhaindzadeh, A.
出版情報:
Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium. pp.18-27, 2003. Pennington, N.J.. Electrochemical Society
Evtukh, A. ; Kizjak, A. ; Litovchenko, V. ; Claeys, C. ; Simoen, E.
出版情報:
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.221-226, 2005. Dordrecht. Kluwer Academic Publishers
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium. pp.50-65, 2004. Pennington, NJ. Electrochemical Society
Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
出版情報:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.257-262, 2002. Warrendale, Pa. Materials Research Society
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.420-439, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Rafi, J.M. ; Simoen, E. ; Claeys, C. ; Ulyashin, A. ; Job, R. ; Fahrner, W. ; Versluys, J. ; Clauws, P. ; Lozano, M. ; Campabadal, F.
出版情報:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.96-105, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Agopian, P. G. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.512-519, 2005. Pennington, N.J.. Electrochemical Society
Galeti, M. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.538-547, 2005. Pennington, N.J.. Electrochemical Society
Simoen, E. ; Hayama, K. ; Takakura, K. ; Mercha, A. ; Claeys, C. ; Ohyama, H.
出版情報:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.455-463, 2005. Pennington, N.J.. Electrochemical Society
Simoen, E. ; Huang, Y. L. ; Claeys, C. ; Raft, J. M. ; Job, R. ; Fahrner, W. R. ; Versluys, J. ; Clauws, P.
出版情報:
Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France. pp.165-175, 2005. Pennington, N.J.. Electrochemical Society
Pavanello, M.A. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
出版情報:
Silicon-on-insulator technology and devices XII : proceedings of the international symposium. pp.289-294, 2005. Pennington, N.J.. Electrochemical Society
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.73-89, 2005. Pennington, N.J.. Electrochemical Society
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.386-395, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Pavanello, M. A. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.464-471, 2005. Pennington, N.J.. Electrochemical Society
Pavanello, M. A. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium. pp.21-26, 2004. Pennington, N.J.. Electrochemical Society
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; Serra-Gallifa, X. ; van Meer, H. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G.
出版情報:
Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.437-442, 2003. Pennington, N.J.. Electrochemical Society
Nicolett, A.S. ; Martino, J.A. ; Simoen, F. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.28-34, 2002. Pennington, N.J.. Electrochemical Society
Poyai, A. ; Simoen, E. ; Claeys, C. ; Rooyackers, R. ; Redolfi, A.
出版情報:
Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.213-222, 2002. Pennington, N.J.. Electrochemical Society
Pavanello, M.A. ; Martino, J.A. ; Mercha, A. ; Rafi, J.M. ; Simoen, E. ; Claeys, C. ; van Meer, H. ; De Meyer, K.
出版情報:
Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.205-212, 2002. Pennington, N.J.. Electrochemical Society
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.386-395, 2003. Pennington, NJ. Electrochemical Society
Lukyanchikova, N. ; Garbar, N. ; Smolanka, A. ; Simoen, E. ; Claeys, C.
出版情報:
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.255-260, 2005. Dordrecht. Kluwer Academic Publishers
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
Pavanello, M.A. ; Martino, J.A. ; Simoen, E. ; Mercha, A. ; Claeys, C. ; Dc Meyer, K.
出版情報:
Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium. pp.112-119, 2003. Pennington, N.J.. Electrochemical Society
Raft, J.M. ; Simoen, E. ; Claeys, C. ; Ulyashin, A. ; Job, R. ; Fahrner, W. ; Versluys, J. ; Clauws, P. ; Lozano, M ; Campabadal, F.
出版情報:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.96-105, 2003. Pennington, NJ. Electrochemical Society
Poyai, A. ; Simoen, E. ; Claeys, C. ; Huber, A. ; Graef, D. ; Gaubas, E.
出版情報:
Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.694-706, 2002. Pennington, NJ. Electrochemical Society
Claeys, C. ; Ikegami, M. ; Kobayashi, K. ; Nakabayashi, M. ; Ohyama, H. ; Simoen, E. ; Sunaga, H. ; Takami, Y. ; Takizawa, H. ; Yoneoka, M.
出版情報:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A29.3-, 2001. Warrendale. Materials Research Society
Huang, Y.L. ; Simoen, E. ; Job, R. ; Claeys, C. ; Dungen, W. ; Ma, Y. ; Fahrner, W.R. ; Versluys, J. ; Clauws, P.
出版情報:
Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.307-312, 2005. Warrendale, Pa.. Materials Research Society
Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium. pp.430-436, 2002. Pennington, N.J.. Electrochemical Society
Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany. pp.75-92, 2001. Pennington, N.J.. Electrochemical Society
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.420-439, 2003. Pennington, NJ. Electrochemical Society
Poyai, A. ; Simoen, E. ; Claeys, C. ; Hayama, K. ; Kobayashi, K. ; Ohyama, H.
出版情報:
Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany. pp.93-102, 2001. Pennington, N.J.. Electrochemical Society
Poyai, A. ; Simoen, E. ; Claeys, C. ; Huber, A. ; Graef, D. ; Gaubas, E.
出版情報:
Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.694-704, 2002. Pennington, NJ. Electrochemical Society
国際会議録
