Rosner, H. ; Meyendorf, N. ; Sathish, S. ; Matikas, T. E.
出版情報:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.73-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Hoffmann, J. ; Sathish, S. ; Khobaib, M. ; Meyendorf, N. ; Netzelmann, U. ; Matikas, T. E.
出版情報:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.67-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
出版情報:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.256-265, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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