High-resolution nondestructive evaluation at the Center for Materials Diagnosis
- 著者名:
Meyendorf, N. ( Univ. of Dayton Research Institute (USA) ) Sathish, S. ( Univ. of Dayton Research Institute (USA) ) Druffner, C.J. ( Univ. of Dayton Research Institute (USA) ) Blackshire, J.L. ( Univ. of Dayton Research Institute (USA) and Univ. of Dayton (USA) ) Hoffmann, J.P. ( Univ. of Dayton Research Institute (USA) and S&K Technologies Inc. (USA) ) Zhan, Q. ( Univ. of Dayton Research Institute (USA) ) Andrews, R.J. ( Univ. of Dayton Research Institute (USA) ) - 掲載資料名:
- Testing, Reliability, and Application of Micro- and Nano-Material Systems II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5392
- 発行年:
- 2004
- 開始ページ:
- 256
- 終了ページ:
- 265
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453099 [0819453099]
- 言語:
- 英語
- 請求記号:
- P63600/5392
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
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5
国際会議録
Nondestructive characterization of corrosion protective coatings on aluminum alloy substrates
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SPIE - The International Society of Optical Engineering |
MRS-Materials Research Society |
SPIE - The International Society of Optical Engineering |