1.

国際会議録
国際会議録
1. 31 New Materials, Processes and Device Structures for 65nm CMOS Technology Node and Beyond
Nguyen, B.-Y. ; Them, A. ; Zhang, D. ; White, T. ; Sadaka, M. ; Triyoso, D. ; Schaeffer, J. ; Goolsby, B. ; Dhandapani, V. ; Nguyen, T. ; Vartanian, V. ; McCormick, L. ; Theodore, D. ; Zollner, S. ; Xie, Q. ; Wang, X.-D. ; Canonico, M. ; Kotte, M. ; Shi, Z. ; Mathew, L. ; Zavala, M. ; Parker, C. ; Cottard, H. ; Hildreth, J. ; Prabhu, L. ; Rai, R. ; Murphy, S. ; Montgomery, P. ; Kalpat, S. ; Ramon, M. ; Demkov, A. ; Taylor, B. ; Gilmer, D. ; Adams, V. ; Jiang, J. ; Chen, J. ; Chang, C.-H. ; Kaushik, V. ; Chandna, L. ; Sadd, M. ; Barr, A. ; Vandooren, A. ; Pham, D. ; Mendlcino, M. ; Cheek, J. ; Tseng, H. ; White, B. ; Tobin, P. ; Orlowski, M. ; Venkatesan, S. ; Mogab, J. (Invited Paper)
出版情報: Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium.  pp.259-273,  2005.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2005-05
2.

国際会議録
国際会議録
2. OPTICAL CHARACTERISTICS OF POROUS SILICON
Tischler, M.A. ; Collins, R.T. ; Tsang, J.C. ; Stathis, J.H. ; Batstone, J.L. ; Zollner, S.
出版情報: Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A..  pp.189-196,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 256
3.

国際会議録
国際会議録
3. 3C-SiC buffer layers converted from Si at a low temperature
Liaw, H. M. ; Hong, S. Q. ; Fejes, P. ; Werho, D. ; Tompkins, H. ; Zollner, S. ; Wilson, S. R. ; Linthicum, K. J. ; Davis, R. F.
出版情報: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.219-,  1999.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 572
4.

国際会議録
国際会議録
4. Theoretical and Experimental Analysis of the Low Dielectric Constant of Fluorinated Silica
Angyal, M. ; baugh, Ash. ; D, M. ; Demkov, A. ; Filipiak, S. ; Gregory, R. B. ; Kottke, M. ; Liu, R. ; Mclntyre, L. C. ; Werho, D. ; Zollner, S.
出版情報: The optical properties of materials : symposium held November 30-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.255-260,  2000.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 579
5.

国際会議録
国際会議録
5. Spectroscopic Ellipsometry as a Potential In-Line Optical Metrology Tool For Relative Porosity Measurements of Low- K Dielectric Films
Edwards, N.V. ; Vella, J. ; Xie, Q. ; Zollner, S. ; Werho, D. ; Adhihetty, I. ; Liu, R. ; Tiwald, T.E. ; Russell, C. ; Vires, J. ; Junker, K.H.
出版情報: Surface engineering 2001 - fundamentals and applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A..  pp.101-106,  2002.  Warrendale, Penn.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 697
6.

国際会議録
国際会議録
6. New Ge-Sn Materials With Adjustable Bandgaps and Lattice Constants
Bauer, Matthew R. ; Tolle, John ; Chizmeshya, A.V.G. ; Zollner, S. ; Menendez, J. ; Kouvetakis, J.
出版情報: Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.49-54,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 744
7.

国際会議録
国際会議録
7. Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry
Edwards, N.V. ; Lindquist, O.P.A. ; Madsen, L.D. ; Zollner, S. ; Jarrehdahl, K. ; Cobet, C. ; Peters, S. ; Esser, N. ; Konkar, A. ; Aspnes, D.E.
出版情報: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.509-514,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 693
8.

国際会議録
国際会議録
8. Optical Vibrational and Structural Properties of Ge1-xSnx Alloys by UHV-CVD
Taraci, Jennifer ; Zollner, S. ; McCartney, M.R. ; Menendez, Jose ; Smith, D.J. ; Tolle, John ; Bauer, M. ; Duda, Erika ; Edwards, N.V. ; Kouvetakis, J.
出版情報: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.631-636,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 692
9.

国際会議録
国際会議録
9. Theoretical And Experimental Analysis Of The Low Dielectric Constant Of Fluorinated Silica
Demkov, A.A. ; Zollner, S. ; Liu, R. ; Werho, D. ; Kottke, M. ; Gregory, R.B. ; Angyal, M. ; Filipiak, S. ; Adams, G.B.
出版情報: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D3.8-,  2001.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 612
10.

国際会議録
国際会議録
10. Si3H8 Based Epitaxy of Biaxially Stressed Silicon Films Doped with Carbon and Arsenic for CMOS Applications
Bauer, M. ; Zollner, S. ; Theodore, N.D. ; Canonico, M. ; Tomasini, P. ; Nguyen, B.-Y. ; Arena, C.
出版情報: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.143-150,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 864