Sathish, S. ; Jato, K. V. ; Martin, R. W. ; Reibel, R.
出版情報:
Health monitoring and smart nondestructive evaluation of structural and biological systems V : 27 February-1 March 2006, San Diego, California, USA. pp.617703-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Frouin, J. ; Maurer, J. ; Sathish, S. ; Eylon, D. ; Na, J. K. ; Matikas, T. E.
出版情報:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.79-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.55-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Rosner, H. ; Meyendorf, N. ; Sathish, S. ; Matikas, T. E.
出版情報:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.73-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Hoffmann, J. ; Sathish, S. ; Khobaib, M. ; Meyendorf, N. ; Netzelmann, U. ; Matikas, T. E.
出版情報:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.67-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Schumaker, E. J. ; Shen, L. ; Ruddell, M. J. ; Sathish, S. ; Murray, P. T.
出版情報:
Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.473-, 2000. Pittsburgh, Pa.. MRS-Materials Research Society
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.172-182, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.122-131, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.184-193, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering