1.

国際会議録
国際会議録
1. Test method for multiband imaging sensors
Bijl, P. ; Hogervorst, M.A.
出版情報: Infrared imaging systems: design, analysis, modeling, and testing XIV : 23-24 April 2003, Oriando, Florida, USA.  pp.208-219,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5076
2.

国際会議録
国際会議録
2. Conspicuity and identifiability: efficient calibration tools for synthetic imagery
Toet, A. ; Hogervorst, M.A. ; Bijl, P.
出版情報: Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA.  pp.1-12,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5431
3.

国際会議録
国際会議録
3. TOD, NVTherm, and TRM3 model calculations: a comparison
Bijl, P. ; Hogervorst, M.A. ; Valeton, J.M.
出版情報: Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA.  pp.51-62,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4719
4.

国際会議録
国際会議録
4. Performance comparison of different gray-level image fusion schemes through a universal image quality index
Toet, A. ; Hogervorst, M.A.
出版情報: Signal processing, sensor fusion, and target recognition XII : 21-23 April 2003, Oriando, Florida, USA.  pp.552-561,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5096
5.

国際会議録
国際会議録
5. BAXSTER: an image quality tester for x-ray baggage screening systems
Bijl, P. ; Hogervorst, M.A. ; Valeton, J.M. ; Ruiter, C.J.
出版情報: Sensors, and command, control, communications, and intelligence (C31) technologies for homeland defense and law enforcement II : 21-25 April 2003, Orlando, Florida, USA.  pp.341-351,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5071
6.

国際会議録
国際会議録
6. Human search with a limited field of view: the effect of scanning parameters and scene content
Hogervorst, M.A. ; Bijl, P. ; Toet, A. ; Valeton, J.M.
出版情報: Targets and backgrounds VIII : characterization and representation : 1-3 April 2002, Orland, USA.  pp.83-94,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4718
7.

国際会議録
国際会議録
7. Identifiability: a fast way to measure identification performance
Hogervorst, M.A. ; Toet, A. ; Bijl, P. ; Miller, B.
出版情報: Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA.  pp.96-103,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5407
8.

国際会議録
国際会議録
8. Identification of military targets and simple laboratory test patterns in band-limited noise
Bijl, P. ; Hogervorst, M.A. ; Toet, A.
出版情報: Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA.  pp.104-115,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5407