Infrared imaging systems: design, analysis, modeling, and testing XIV : 23-24 April 2003, Oriando, Florida, USA. pp.208-219, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA. pp.1-12, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA. pp.51-62, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal processing, sensor fusion, and target recognition XII : 21-23 April 2003, Oriando, Florida, USA. pp.552-561, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Bijl, P. ; Hogervorst, M.A. ; Valeton, J.M. ; Ruiter, C.J.
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Sensors, and command, control, communications, and intelligence (C31) technologies for homeland defense and law enforcement II : 21-25 April 2003, Orlando, Florida, USA. pp.341-351, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hogervorst, M.A. ; Bijl, P. ; Toet, A. ; Valeton, J.M.
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Targets and backgrounds VIII : characterization and representation : 1-3 April 2002, Orland, USA. pp.83-94, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hogervorst, M.A. ; Toet, A. ; Bijl, P. ; Miller, B.
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Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.96-103, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.104-115, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering