1.

国際会議録
国際会議録
1. Calculation of the power spectral density of the wavefront
Zhang,R. ; Cai,B. ; Yang,C. ; Xu,Q. ; Gu,Y.
出版情報: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.295-300,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4231
2.

国際会議録
国際会議録
2. Research on technology of digital knife-edge test [6150-158]
Zhang,J. ; Zhang,R. ; Cai,B. ; Liu,P.
出版情報: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.61500M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6150