Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium. pp.59831J-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XIII : 2 April, 2002, Orlando, USA. pp.185-193, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.260-265, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Wang, K. ; Wang, J. ; Liu, G. ; Zhu, C. ; Zhang, Y. ; Du, H.
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X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California. pp.39-49, 1998. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Yang, J. ; Li, J. ; Zhang, Y. ; Wang, J. ; Cheng, J.
出版情報:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.614936-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering