1.

国際会議録
国際会議録
1. Strained- Si/SiGe/Si heterostructures : Nanos cale structural, chemical and electrical characterization (invited paper)
Rozgonyi, G. ; Lu, J. ; Zhao, W. ; Zhang, R. ; Chaumont, M.
出版情報: Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France.  pp.30-41,  2005.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2005-10
2.

国際会議録
国際会議録
2. Characterization of strained-Si/SiGe/Si heterostructures with capacatance methods [6260-44]
Yarykin, N. ; Zhang, R. ; Rozgonyi, G.
出版情報: Micro- and Nanoelectronics 2005.  pp.626017-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6260