1.

国際会議録
国際会議録
1. Technique to transform optical deflection equations into linear difference ones for tomography
Y. Song ; Z. Zhao
出版情報: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  1  pp.72831Y-1-72831Y-8,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7283
2.

国際会議録
国際会議録
2. Characterization of E2V CCD 203_82 with low noise AACAS controller
Y. Shang ; Q. Song ; Y. Guan ; Y. Song ; Z. Zhao
出版情報: High energy, optical, and infrared detectors for astronomy III.  pp.70211R-1-70211R-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7021
3.

国際会議録
国際会議録
3. Numerical simulation of auto-adapted deflection tomography
Y. Song ; Z. Zhao
出版情報: Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China.  pp.71602Y-1-71602Y-9,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7160
4.

国際会議録
国際会議録
4. Auto-adapted iterative deflection tomography approaching high frequency shock waves field
Y. Song ; Z. Zhao
出版情報: Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China.  pp.71600M-1-71600M-15,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7160
5.

国際会議録
国際会議録
5. The lowest sampling frequency not existing in theory
Y. Song ; Z. Zhao
出版情報: Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China.  pp.71601G-1-71601G-9,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7160