Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China. pp.63574X-1-63574X-7, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sensors and instruments, computer simulation, and artificial intelligence : Seventh International Symposium on Instrumentation and Control Technology : 10-13 October, 2008, Beijing, China. pp.71271J-1-71271J-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Measurement theory and systems and aeronautical equipment : Seventh International Symposium on Instrumentation and Control Technology, 10-13 October 2008, Beijing, China. pp.712823-1-712823-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor lasers and applications III : 12-13 November 2007, Beijing, China. pp.68240Q-1-68240Q-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Quantum optics, optical data storage, and advanced microlithography : 12-14 November 2007, Beijing, China. pp.68271T-1-68271T-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Nanophotonics, nanostructure, and nanometrology II : 12-14 November 2007, Beijing, China. pp.68311B-1-68311B-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
B. Zhang ; X. Wang ; X. K. Wang ; Z. Zhang ; X. Zhang
出版情報:
Large mirrors and telescopes : 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China. pp.72810O-1-72810O-5, 2009. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering