Systematic investigation of the growth of LaNiO3/PZT/LaNiO3/Si and LaNiO3/PZT/LaNiO3/polymer/Si for IR detector applications
- 著者名:
Yun, S.H. ( Univ. of Kansas (USA) ) Vallejo, R.N. Wu, J.Z. Tidrow, M.Z. ( Missile Defense Agency (USA) ) Beratan, H. ( Raytheon Commercial Infrared (USA) ) Hanson, C.M. - 掲載資料名:
- Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4721
- 発行年:
- 2002
- 開始ページ:
- 75
- 終了ページ:
- 82
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444714 [0819444715]
- 言語:
- 英語
- 請求記号:
- P63600/4721
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
Characterization of Highly Textured PZT Thin Films Grown on LaNiO3 Coated Si Substrates by MOCVD
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |