1.

国際会議録
国際会議録
1. AN ULTRASENSITIVE METHOD TO REVEAL DEFECTS THAT DEGRADE THE LOCALIZED RECOMBINATION LIFETIME OF THE NEAR SURFACE REGION OF BULK Si AND THIN EPILAYERS
Higgs, V. ; Chin, F. ; Wang, X. ; Kitagawara, Y. ; Yoshida, T.
出版情報: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1564-1575,  1998.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-1(2)
2.

国際会議録
国際会議録
2. Bulk Lifetime Decreasing Phenomena Induced by Light-Illumination in High-Purity P-Type Cz-Si Crystals
Yoshida, T. ; Kitagawara, Y.
出版情報: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.450-454,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-13
3.

国際会議録
国際会議録
3. Capability of Reliable Bulk Lifetime Evaluation in High-Purity Si by a Photoconductive Decay Measurement with a Chemical Passivation Technique
Yoshida, T. ; Kitagawara, Y.
出版情報: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.455-461,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-13