1.

国際会議録
国際会議録
1. Physical experimental simulation of indirect surface display caused by buried geological anomaly
Chen,J. ; Li,Q. ; Xu,J.
出版情報: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.47-51,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4221
2.

国際会議録
国際会議録
2. Improvement of tapping-mode scanning near-field optical microscope
Zhuo,W. ; Li,Q. ; Sun,J. ; Xu,J. ; Zhao,J. ; Guo,J.
出版情報: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.23-26,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4223