1.

国際会議録
国際会議録
1. Angiogenic response in the chick chorioallantoic membrane model to laser-irradiated cartilage
Karamzadeh,A.M. ; Wong,B.J.F. ; Milner,T.E. ; Wilson,M. ; Liaw,L.-H.L. ; Nelson,J.S.
出版情報: Proceedings of lasers in surgery : advanced characterization, therapeutics, and systems IX : 23-24 January 1999, San Jose, California.  pp.243-249,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3590
2.

国際会議録
国際会議録
2. Performance of multiresolution pattern classifiers in medical image encoding from wavelet coefficient distributions
Mitra,S. ; Wilson,M. ; Kompella,S.
出版情報: Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California.  Part 1  pp.256-263,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3338
3.

国際会議録
国際会議録
3. Automated microcalcification detection in mammograms using statistical variable-boxthreshld filter method
Wilson,M. ; Mitra,S. ; Roberson,G.H. ; Shieh,Y.-Y.
出版情報: Applications of soft computing : 28-29 July 1997, San Diego, California.  pp.195-200,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3165
4.

国際会議録
国際会議録
4. Lethal photosensitization of biofum-grown bacteria
Wilson,M.
出版情報: Proceedings of photochemotherapy : photodynamic therapy and other modalities III : 4-6 September 1997, San Remo, Italy.  pp.68-78,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3191
5.

国際会議録
国際会議録
5. New COCOS Method for Monitoring the Reliability of Thin Gate Oxides
Wilson,M. ; Lagowski,J. ; Sartchouk,A. ; Jastrzbski,L. ; D'Alnico,J. ; DeBusk,D.K. ; Buczkowski,A.
出版情報: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.373-384,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3895
6.

国際会議録
国際会議録
6. Morphological and wavelet filtering for shear-beam image restoration
Wilson,M. ; Mitra,S. ; Krile,T.F.
出版情報: Digital image recovery and synthesis IV : 20-21 July 1999, Denver, Colorado.  pp.98-105,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3815
7.

国際会議録
国際会議録
7. Color group selection for computer interfaces
Lyons,P. ; Moretti,G. ; Wilson,M.
出版情報: Human vision and electronic imaging V : 24-27 January 2000, San Jose, USA.  pp.302-313,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3959
8.

国際会議録
国際会議録
8. "Risk Assessment, Fitness and Field Release of a Transgenic Entomopathogenic Nematode"
Wilson,M. ; Hashmi,S. ; Gaugler,R.
出版情報: Enhancing biocontrol agents and handling risks.  pp.177-187,  2001.  Amsterdam.  IOS Press
シリーズ名: NATO science series. Series 1, Life and behavioural sciences
シリーズ巻号: 339
9.

国際会議録
国際会議録
9. Contact potential difference methods for full wafer characterization of Si/Si02 interface defects induced by plasma processing (Invited Paper)
Edelman,P. ; Savchouk,A. ; Wilson,M. ; Jastrzebski,L. ; Lagowski,J.J. ; Nauka,K. ; Ma,S. ; Hoff,A.M. ; DeBusk,D.K.
出版情報: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II :23-24 September 1998 Santa Clara, California.  pp.126-136,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3509
10.

国際会議録
国際会議録
10. Mechanism of killing of streptococcus mutans by light-activated drugs
Burns,T. ; Wilson,M. ; Pearson,G.J.
出版情報: Proceedings of photochemotherapy : photodynamic therapy and other modalities : 14-16 September 1995, Barcelona, Spain.  pp.288-297,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2625
11.

テクニカルペーパー
テクニカルペーパー
11. A Hierarchical Approach to Optimal Aerodynamic Design
Sevant,N. ; Bloor,M. ; Wilson,M.
出版情報: 7th AIAA/USAF/NASA/ISSMO Symposium on Multidisciplinary Analysis and Optimization : a collection of technical papers, September 2-4, 1998/St. Louis, Missouri.  pt. 2  pp.1099-1107,  1998.  Reston, VA.  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : Symposium on Multidisciplinary Analysis and Optimization
シリーズ巻号: CP9811
12.

テクニカルペーパー
テクニカルペーパー
12. A Comprehensive Phenomenological Model of the Jet Mixing Process in D.I. Diesel Engines
Wilson,M. ; Wallace,F.J.
出版情報: Combustion, heat transfer, and analysis.  pp.197-212,  1986.  Warrendale, PA.  Society of Automotive Engineering, Inc.
シリーズ名: SAE publication
シリーズ巻号: P-182
13.

国際会議録
国際会議録
13. Efficient lossless coding model for medical images by applying integer-to-integer wavelet transform to segmented images
Yang,S. ; Zamora,G. ; Wilson,M. ; Mitra,S.
出版情報: Medical Imaging 2000: Image Processing.  Part2  pp.1566-1572,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3979
14.

国際会議録
国際会議録
14. Small signal ac-surface photovoltage technique for noncontact monitoring of near-surface doping for IC-processing
Marinskiy,D.N. ; Lagowski,J.J. ; Wilson,M. ; Jastrzebski,L. ; Santiesteban,R. ; Elshot,K.
出版情報: Process Control and Diagnostics.  pp.72-77,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4182
15.

国際会議録
国際会議録
15. Effect of Fe and Cu contamination on the reliability of ultrathin gate oxides
D'Amico,J. ; Jastrzebski,L. ; Wilson,M. ; Savtchouk,A.
出版情報: In-Line Methods and Monitors for Process and Yield Improvement.  pp.124-135,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3884