1.

国際会議録
国際会議録
1. Contact-free on-axis metrology for the fabrication and testing of complex optical systems [5965-36]
Courteville, A. ; Wilhelm, R. ; Delaveau, M. ; Garcia, F. ; de Vecchi, F.
出版情報: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.596510-596511,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5965
2.

国際会議録
国際会議録
2. Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer [5856-41]
Wilhelm, R. ; Courteville, A. ; Garcia, F. ; FOGALE nanotech (France)
出版情報: Optical Measurement Systems for Industrial Inspection IV.  pp.469-480,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5856
3.

国際会議録
国際会議録
3. A novel low-coherence fibre optic interferometer for position and thickness measurements with unattained accuracy [6341-62]
Courteville, A. ; Wilhelm, R. ; Garcia, F.
出版情報: Speckle06: Speckles, From Grains to Flowers.  pp.63411Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6341